电镜中心

时间:2018-03-14浏览:1640设置

上海科技大学物质科学与技术学院电镜中心始建于2015,旨在建立一个国际一流水平的电镜中心,建成之后将成为集教学、科研、服务等功能为一体的国际一流公共科学研究和技术开发平台。中心已经购买了一批先进的设备,包括一台双球差矫正透射电子显微镜和一台高分辨扫描电子显微镜,可以在原子尺度观察材料的微观结构,同时利用专门的样品杆可以实现样品在气体、液体等环境下的动态观测。在中心建设之初,上海科技大学邀请海外知名电镜专家Osamu Terasaki教授来我校任电镜中心主任一职,对电镜中心的建设作了全面的规划,之后又邀请美国伊利诺伊大学香槟分校的左建民教授作为中心的科研主任,为电镜中心的发展给出指导,进一步提升了中心的科研实力和影响力。该平台的建设将提升上海科技大学在尖端物质科学领域的研究水平,推动学院在材料、化学和物理等领域的发展,为一流科研成果的出现提供重要的支持和保障。


The Electron Microscopy Center in the School of of Science and Technology was established in 2015 to establish a world-class Electron Microscopy Center. Upon completion, it will become a great platform for scientific research and technology development, as well as serving for teaching, research and public services. The Center has ordered a number of state-of-the-art equipments, including a double Cs-corrected transmission electron microscope and a high-resolution scanning electron microscope, to visualize the microstructure of the material at the atomic scale. Meanwhile, by taking advantage of the specialized in-situ sample holders, dynamic behaviors will be also observed under certain environmental conditions, such as gas, liquid, mechanical and low temperature. At the beginning of the EM center, Shanghaitech University invited Prof. Osamu Terasaki, a famous EM expert, to be the director and make a comprehensive plan for the development of EM Center. Later on, Prof. Jianmin Zuo from the University of Illinois Urbana-Champaign was invited to be the scientific research director, for further enhancement of scientific research strength and influence. The built of this platform will improve the research level of ShanghaiTech University in the field of cutting-edge material science, promote the development of the university in such fields as materials, chemistry and physics, and provide strong support for the emergence of first-class scientific research achievements.


More Introduction: https://www.osamuterasaki.com



成员信息

Prof. Osamu Terasaki

Director

Email: osamuterasaki@mac.com

Prof. Jianmin Zuo

Research Director

Email: jianzuo@illinois.edu

Yanhang Ma 马延航

Assistant Professor

Emailmayh2@shanghaitech.edu.cn

Yi Yu 于奕

Assistant Professor

Emailyuyi1@shanghaitech.edu.cn

Peter Oleynikov

Emailpoleynikov@shanghaitech.edu.cn

Yanyan Jia 贾艳艳

Engineer

Email: jiayy@hanghaitech.edu.cn

Tel: 021-20685311

Weiyan Liu 刘为燕

Engineer

Emailliuwy@shanghaitech.edu.cn

Haiyin Zhu 朱海音

Engineer

Emailzhuhy6@shanghaitech.edu.cn


Alvaro Mayoral Garcia

Research Associated Professor

Email: amayoral@shanghaitech.edu.cn

Qing Zhang 张青

Research Assistant Professor

Email: zhangqing1@shanghaitech.edu.cn

Sam Stevens

Email: s.stevens@exeter.ac.uk





About Osamu



Positions

Professor, Head of Centre for High Resolution Electron Microscopy, ShanghaiTech University



Awards

2003: Friendship Award, State Administration of Foreign Experts Affairs of the P.R. China.

2007: The Donald W Breck Award, International Zeolite Association

2008: Humboldt Research Award, Alexander von Humboldt Found.

2010: Honorary Member of Scandinavian Electron Microscopy Society

2014: Honorary Member of Japan Association of Zeolite



Qualifications

1965: Dept of Phys, Faculty of Science, Tohoku Univ, B.Sc. with Honor.

1967: Graduate course, Dept of Physics, Tohoku University, M.Sc.

1982: Doctor of Science, Tohoku University, 28th April.



Previous Positions

1967 – 1994 Assist Prof, Dept of Phys, Faculty of Science, Tohoku Univ.

1994 – 2002 Assoc. Prof., Head of the Microstructure Physics, Dept of Phys., Tohoku Univ.

1996 – 2001 Research Director, Core Research for Evolutional Science & Technology (CREST), Japan Science & Technology Corporation (JST).

2002 – 2003 Prof, Dept. Phys, Graduate School of Science, Tohoku Univ.

2003 – 2010 Professor, Head of Structural Chemistry, Arrhenius Lab., Stockholm University.

2009 – 2013 Invited Guest Professor of WCU Programme, Graduate School of EEWS, KAIST, Daejeon, Republic of Korea

2014-2017 Guest Professor of Brain Korea 21 Plus (BK21 Plus) program, Graduate School of EEWS, KAIST, Daejeon, Republic of Korea

2014 - 2017 Visiting Professor, University of California, Berkeley, CA94720, USA



Biography

Osamu Terasaki (OT) was born in Yamaguchi (next neighbour of Hiroshima), Japan in 1943 during the World War II and grew up in Yamagata before moving to Sendai to attend University where he graduated from the Physics Department of Tohoku University. He studied magnetism at the Department for his Master's entitled “Magnetic study of Co2Mn2C ”. Immediately after receiving his Master degree, OT became a faculty member in the Department and worked for 37 years (an assistant prof, 1967-, associate prof, 1994- and prof, 2002-2003). During the period, he spent for one and a half years at Cambridge University (Sir John Meurig Thomas) as a Royal Society Guest Research Fellow and for four months as a Guest Prof of NFR at Lund University Sweden (Profs Jan-Olov Bovin & Sten Andersson), and studied fine structures of zeolites. Just before joining Cambridge University, he got the title, Doctor of Science (DSc), on “Studies of ordered structures and incommensurability in Au-based alloys”.

OT was selected as one of the first Research Directors of Core Research for Evolutional Science & Technology, Japan Science and Technology Agency (JST) for his project “New Arrayed Clusters in Microporous Materials: Syntheses, Structures and Physical Properties” (1995).

OT applied to the position, Professor of Structural Chemistry, Stockholm University (Closing March 30th, 2001). Formally he resigned from Prof., Dept of Phys., Tohoku University and took the position from April 1st, 2003. It took quite long time to move including successive appeals for the decisions at each level, it was worth for waiting. He has really enjoyed a life at new environments and learned enormously in science as well as social. He is currently has been working at Stockholm University, KAIST Korea, UC Berkeley USA and ShanghaiTech China. Especially he is currently working hard to set up an active EM centre (CħEM ) at ShanghaiTech and to create open and fair scientific atmosphere.

OT’s research interest lies generally in scattering, diffraction, imaging using electrons and X-ray (photons). These approaches will fit well for studying structural details of nano- complex materials and accumulation details of adsorbates within pores during gas- adsorption process, and also for observing kinetic/reaction process directly in an atomic scale.

OT has received the Friendship Award from P.R. China (2003), the Donald W. Breck Award from International Zeolite Association (2007) and Humboldt-Research Award from Alexander von Humboldt Foundation (2008) and the Magnolia Award from Shaghai Municipal People's Government (2018). He is an honorary member of Scandinavian Electron Microscopy Society (SCANDEM) and Japan Association of Zeolite (JAZ) since 2010 and 2014, respectively.

OT has over 450 publications and average citations per item is 76 times. His h-index is 83 (as of 2018.10.08, from Google Scholar).



Select Publications

  • Ordered nanoporous arrays of carbon supporting high dispersions of platinum nanoparticles.,SH Joo, SJ Choi, I Oh, J Kwak, Z Liu, O Terasaki, R Ryoo, Nature 412 (6843), 169 2530 2001

  • Synthesis of new, nanoporous carbon with hexagonally ordered mesostructure, S Jun, SH Joo, R Ryoo, M Kruk, M Jaroniec, Z Liu, T Ohsuna, O Terasaki, Journal of the American Chemical Society 122 (43), 10712-10713 2362 2000

  • Novel mesoporous materials with a uniform distribution of organic groups and inorganic oxide in their frameworks, S Inagaki, S Guan, Y Fukushima, T Ohsuna, O Terasaki, Journal of the American Chemical Society 121 (41), 9611-9614 1661 1999

  • An ordered mesoporous organosilica hybrid material with a crystal-like wall structure, S Inagaki, S Guan, T Ohsuna, O Terasaki, Nature 416 (6878), 304 1294 2002

  • Stable single-unit-cell nanosheets of zeolite MFI as active and long-lived catalysts, M Choi, K Na, J Kim, Y Sakamoto, O Terasaki, R Ryoo, Nature 461 (7261), 246 1182 2009

  • Microstructural optimization of a zeolite membrane for organic vapor separation, Z Lai, G Bonilla, I Diaz, JG Nery, K Sujaoti, MA Amat, E Kokkoli, Science 300 (5618), 456-460 951 2003

  • Direct imaging of the pores and cages of three-dimensional mesoporous materials, Y Sakamoto, M Kaneda, O Terasaki, DY Zhao, JM Kim, G Stucky, HJ Shin, Nature 408 (6811), 449 881 2000

  • Large-pore apertures in a series of metal-organic frameworks, H Deng, S Grunder, KE Cordova, C Valente, H Furukawa, M Hmadeh, Science 336 (6084), 1018-1023 878 2012

  • Synthesis and characterization of chiral mesoporous silica, S Che, Z Liu, T Ohsuna, K Sakamoto, O Terasaki, T Tatsumi, Nature 429 (6989), 281 654 2004

  • Structure of the microporous titanosilicate ETS-10, MW Anderson, O Terasaki, T Ohsuna, A Philippou, SP MacKay, A Ferreira, Nature 367 (6461), 347 566 1994

  • A novel anionic surfactant templating route for synthesizing mesoporous silica with unique structure, S Che, AE Garcia-Bennett, T Yokoi, K Sakamoto, H Kunieda, O Terasaki, Nature materials 2 (12), 801 540 2003

  • Cubic hybrid organic− inorganic mesoporous crystal with a decaoctahedral shape, S Guan, S Inagaki, T Ohsuna, O Terasaki, Journal of the American Chemical Society 122 (23), 5660-5661 406 2000

  • Ultra-stable nanoparticles of CdSe revealed from mass spectrometry, A Kasuya, R Sivamohan, YA Barnakov, IM Dmitruk, T Nirasawa, Nature materials 3 (2), 99 399 2004

  • Structural study of mesoporous MCM-48 and carbon networks synthesized in the spaces of MCM-48 by electron crystallograph, M Kaneda, T Tsubakiyama, A Carlsson, Y Sakamoto, T Ohsuna, The Journal of Physical Chemistry B 106 (6), 1256-1266 380 2002

  • Ordered mesoporous silica with large cage-like pores: structural identification and pore connectivity design by controlling the synthesis temperature and time, JR Matos, M Kruk, LP Mercuri, M Jaroniec, L Zhao, T Kamiyama, Journal of the American Chemical Society 125 (3), 821-829 360 2003

  • Periodic arrangement of silica nanospheres assisted by amino acids, T Yokoi, Y Sakamoto, O Terasaki, Y Kubota, T Okubo, T Tatsumi, Journal of the American Chemical Society 128 (42), 13664-13665 355 2006

  • Tailoring the pore structure of SBA-16 silica molecular sieve through the use of copolymer blends and control of synthesis temperature and time, TW Kim, R Ryoo, M Kruk, KP Gierszal, M Jaroniec, S Kamiya, O Terasaki, The Journal of Physical Chemistry B 108 (31), 11480-11489 341 2004

  • Determination of pore size and pore wall structure of MCM-41 by using nitrogen adsorption, transmission electron microscopy, and X-ray diffraction, M Kruk, M Jaroniec, Y Sakamoto, O Terasaki, R Ryoo, CH Ko, The Journal of Physical Chemistry B 104 (2), 292-301 338 2000

  • Synthesis of self-pillared zeolite nanosheets by repetitive branching, X Zhang, D Liu, D Xu, S Asahina, KA Cychosz, KV Agrawal, Y Al Wahedi, Science 336 (6089), 1684-1687 329 2012

  • Ordered mesoporous Pd/silica− carbon as a highly active heterogeneous catalyst for coupling reaction of chlorobenzene in aqueous media, Y Wan, H Wang, Q Zhao, M Klingstedt, O Terasaki, D Zhao, Journal of the American Chemical Society 131 (12), 4541-4550


School of Physical Sciences and Technology (SPST) Professor Osamu Terasaki, director of Center for High-resolution Electron Microscopy (CћEM), was awarded the 2018 Magnolia Silver Award in recognition of his positive contributions to Shanghais economic and social development, especially for fostering international exchange of advanced technology.





Technologies



Equipment Summary



Transmission Electron Microscopes

  • JEM-2100 Plus with LaB6

  • JEM-ARM300F (Grand)

  • JEM-1400 Plus

  • JEM-ARM300F (Environmental)

  • JEM-F200



Scanning Electron Microscopes

  • Phemon ProX

  • JSM-7800F Prime

  • JSM-6010 Plus/LA

  • JIB-4700F

  • JAMP-9510F



Support Preparation Equipment

  • Ex-situ Pickup system

  • General Sample Holders

  • Environmental and In-situ Sample Holders

  • IB-19520CCP



Transmission Electron Microscopes



200 and 120 kV TEM with LaB6



JEM-2100 Plus

  • Gun: LaB6

  • Resolution: TEM dot 0.19nm, lattice 0.14nm, STEM DF ~ 1nm

  • Magnification: ×3,000 ~ × 2,500,000

  • STEM: JEOL STEM system

  • Detector: HAADF Detector

  • EDS: Oxford X-MAX N 100 TLE , Energy resolution 133eV

  • Chamber Camera: JEOL high Sensitive CMOS camera (flash camera)

  • Bottom mount TVIPS CCD: TemCam-XF416

  • Camera length: Extension up to 3,500mm

  • Image area: 63.5 × 63.5 mm² (16M pixel); High sensitivity; High acquisition speed with large dynamic range.



300 kV Scanning TEM with double Cs correctors



Grand JEM-ARM300F

  • Electron-GUN: Hyper Cold FEG

  • Brightness: 1 × 109 A/cm2 sr (at 300 kV)

  • Pole Piece: Wide GAP (f = 3.6mm, Cs = 1.6mm, Cc = 2.4mm)

  • Acc. Vol. : 300kV, 80kV, 60kV, 40kV

  • Cs Corrector: TEM & STEM Corrector

  • Resolution: TEM Lattice 0.06nm,; STEM BF 0.063nm; STEM DF 0.063nm

  • Magnification: × 2,000 ~ × 1,200,000

  • Camera length: 8 cm ~ 200 cm

  • Detector: BF, LAADF, Hybrid HAADF, 8-Segmented (SAAF)

  • 3D Tomography system

  • EDS: JEOL SDD system (100mm2 × 2)

  • Energy res.: 133eV @Mn K

  • Bottom Camera: Gatan 16M Oneview IS Camera

  • Chamber Camera: Viewing Chamber CCD Camera (JEOL)

  • EELS: Gatan 965 GIF Quantum ER

  • Cooling Holder: Gatan 676



120 kV Microscope



JEM-1400 PLUS

  • Electron Gun: LaB6

  • Acc. Vol. : 120 kV

  • Resolution: TEM Point 0.33 nm, TEM Lattice 0.14 nm; STEM BF 1.5 nm

  • Magnification: × 10,000 ~ × 2,000,000 (Mag mode)

  • EDS: JEOL SDD system (30 mm2 × 1)

  • Solid Angle: 0.18 str

  • Detectable element range: B ~ U

  • Camera : JEOL high Sensitive CMOS Camera (flash camera)

  • Effective pixels: 2,048 (H) × 2,048 (V)

  • Read-out rate: 30 fps (all pixels read out)



In-situ Microscope with differential pumping system



JEM-ARM300F

  • FE-Gun: Hyper Cold FEG

  • Brightness: 1 × 109 A/cm2 sr (at 300 kV)

  • Pole Piece: Wide GAP PolePiece (f = 3.6 mm, Cs = 1.6mm, Cc = 2.4mm)

  • Acc. Vol. : 300kV, 200kV, 80kV, 40kV(TEM)

  • Cs Corrector: TEM Corrector

  • Resolution: TEM Lattice 0.06nm, STEM BF 0.2nm, STEM DF 0.2nm

  • Magnification: × 2,000 – ×1,200,000 (MAG Mode)

  • Camera length: 8cm to 300cm

  • Detector: Pixelated Detector (D Canvas); Annular BF Detector; LAADF Detector; HAADF Detector

  • Gonio (x-tilt) modification for 3D-EDT: Min. tilt speed 0.05˚/sec, 3D Tomography system

  • Stage TMP Pumping: SIP/TMP Dual Pumping System for In-situ

  • EDS: JEOL SDD system (158mm2 × 1) Energy resol: 133eV @MnK

  • Bottom Camera: Gatan Oneview IS Camera

  • Chamber Camera: Viewing Chamber CCD Camera (JEOL)

  • EELS: Gatan977 Dual EELS Enfinium



High Resolution Multi-purpose Microscope



JEM-F200

  • Electron-Gun: Schottky Electron Gun

  • Brightness: 4 × 108 A/cm2 sr (at 200 kV)

  • Pole Piece: HR Pole-Piece (f=2.3mm, Cs=1.0mm, Cc= 1.4mm)

  • Acc. Vol. : 200kV, 80kV

  • Resolution: TEM Point 0.23nm; TEM Lattice 0.1nm; STEM DF 0.19nm

  • Magnification: × 4,000 – ×2,000,000 (Mag mode)

  • Probe Current @200kV: 2.5 nA at 1.0 nm

  • Camera length: 15cm to 350cm

  • Bottom Camera: Gatan Rio 1816 (IS)

  • EDS: JEOL SDD system (100mm2 x1)

  • Solid Angle: 1sr

  • Resolution (FWHM): 133 eV (at 55Fe, 5.9 keV, 1,000 cps)

  • Detectable element range: B to U

  • Bottom Camera: Gatan Rio 1816 (IS)



Scanning Electron Microscopes



Tabletop SEM



Phemon ProX

  • Model: Phemon ProX with EDS .

  • Acceleration voltage: 5 kV, 10 kV, 15 kV

  • Magnification: × 20 - × 150,000

  • Resolution: 17nm

  • Filament: CeB6

  • Detector: BSD, EDS

  • Specialty: Quick imaging; Sample check and quick imaging after synthesis; Direct observation of insulators.

  • Operation Times: 20-30 hrs/week

  • Independent Users: 59 users (including PI, staff scientist, post-doctoral, graduate/undergraduate student)



High Resolution SEM with low vacuum capability



JSM-7800F Prime

  • In-lens Schottky Plus Field Emission Electron Gun: Maximum Beam Current: 20 nA 2kV / 500 nA 30 kV

  • Super Hybrid Lens (SHL): low-acceleration / high-resolution observation EBSD analysis

  • Gentle Beam Super High Resolution (GBSH): Maximum sample bias voltage: -5 kV

  • Back Scattered Electron detector: RBEI detector (retractable)

  • Chamber Camera: CMOS camera system

  • Low Vacuum with secondary electron detector for LV

  • Resolution: 0.7 nm (15 kV), 0.7 nm (1 kV)3.0 nm (5 kVWD10 mm5 nA)

  • Oxford EDS : X-Max Extreme

  • Electron Beam Lithography system: Raith ELPHY Quantum



Tungsten filament



JSM-6010 PLUS/LA

  • Electron Gun: W-hairpin

  • Acc. Vol. : 0.5 kV to 20 kV

  • SEI Resolution: 4 nm at 20 kV; 5 nm at 20 kV (LV Mode)

  • Magnification: ×8 ~ × 300,000

  • Probe current: 1 pA ~ 0.3 A

  • Vacuum range: 10 ~ 100 Pa (LV mode)

  • Stage Movement: 5 axis (X,Y: Motorised)

  • EDS: JEOL SDD system (10mm2 )

  • Detectable elements: B ~ U

  • Energy Resolution: 133eV @Mn Kα



Multi-Beam Focussed Ion Beam System



JIB-4700F

  • Gun: In-lens Schottky Electron Gun

  • Lens system: Hybrid Lens/HL; GB (Gentle Beam Mode)

  • Detector: LED, USD, UED, RBED

  • SEM Resolution: 1.2nm @ 15 kV with GB; 3.0nm @ 0.1kV with GB

  • FIB Resolution: 4.0nm @ 30kV

  • Image magnification: ×50 to 300,000 (in FIB); ×20 to 1,000,000 (in SEM mode)

  • Acc. Voltage: SEM mode 0.5 to 30.0 kV; GB mode 0.1 to 29.9 kV

  • Beam current: 1pA to 300nA (SEM); 1pA to 90nm (Ion Beam)

  • Sample Transfer System: without exposing to air - Ex-situ Pick-up System



Field emission Auger Microprobe



JAMP-9510F

  • Gun: Schottky Field Emission Electron Gun

  • Accelerating voltage: 0.5 ~ 30 kV

  • SEI Resolution: 3.0nm

  • Auger Analysis Spatial Resolution: 8.0nm

  • Magnification: ×25 ~ ×500,000

  • Variable Energy Resolution: 0.05% ~ 0.6%

  • Sensitivity: 120,000 cps/ch or more

  • Analyser: Hemi-Spherical Electrostatic Analyser (HAS)

  • Ultimate vacuum pressure: 5 x 10–8 Pa

  • Ion energy: 0.01 ~ 4 keV

  • Ion-beam current: 2 μA or more at 3,000 eV 0.03 μA or more at 10 eV

  • Sample Transfer System: Without exposing a sample to air



Other Equipment



Ex-situ Pickup And Transfer System



AxisPro

Prepare a block specimen using FIB milling

Transfer the block specimen to a plate by pick-up system

Prepare a TEM lamella by FIB



Sample Holders



Single Tilt Holder (JEOL)



914 High tilt Cooling Holder (Gatan)



High Tilt Holder (JEOL)





Environmental and In-situ Sample Holders



Protochips Atmosphere

  • Pressure range : 3 to 760 Torr

  • Heating range : RT to 1000



Protochips Poseidon

  • Includes electrochemistry package

  • Electrodes : 3

  • Liquid ports : 3 (mixing)



Cross Section Polisher with cooling system



IB-19520CCP

  • TBD







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